作者: O. Hahtela , M. Ruoho , E. Mykkänen , K. Ojasalo , J. Nissilä
DOI: 10.1007/S10765-015-1970-8
关键词: Resistive touchscreen 、 Kapton 、 Dielectric 、 Analytical chemistry 、 Thermoelectric materials 、 Materials science 、 Thermoelectric effect 、 Thermal conductivity 、 Measurement uncertainty 、 Thermal conductivity measurement
摘要: In this work, a measurement system for high-temperature thermal-conductivity measurements has been designed, constructed, and characterized. The is based on the $$3{\upomega }$$ method which an ac technique suitable both bulk thin-film samples. were performed in horizontal three-zone tube furnace whose sample space can be evacuated to vacuum or alternatively protective argon gas environment applied prevent undesired oxidation contamination of material. was tested with several dielectric, semiconductor, metal samples from room temperature up 725 K. test materials chosen so that values covered wide range $$0.37\,\hbox {W}\!\cdot \! \hbox {m}^{-1}\!\cdot {K}^{-1}$$ $$150\,\hbox \!\hbox . An uncertainty analysis carried out. accuracy mainly limited by determination third harmonic voltage over resistive heater strip used heating sample. A typical relative between 5 % 8 % ( $$k=2$$ ). extension also implemented first deposited transferable Kapton foil. Utilizing such prefabricated sensor allows faster as there no need deposit each new