Through Wafer 3D Vertical Micro-Coaxial Probe for High Frequency Material Characterization and Millimeter Wave Packaging Systems
作者： Justin Boone
关键词: Coaxial probe 、 Optoelectronics 、 Characterization (materials science) 、 Materials science 、 Extremely high frequency 、 Wafer 、 Coplanar waveguide
摘要:
sci-hub.st 参考文章(78)
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