Method and device for scanning light
作者： Alexander Sromin , Raviv Erlich , Mordekhai Velger , Sivan Natan-Knaz , Yizhar Weiss
DOI:
关键词: Optics 、 Optic axis of a crystal 、 Light beam 、 Materials science
摘要: A method of scanning a light beam is disclosed. The comprises the along first axis and second axis, such that functional dependence substantially step-wave, other than step-wave.
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