作者: MacCallum J. Robertson , Christopher J. Agostino , Alpha T. N'Diaye , Gong Chen , Mi-Young Im
DOI: 10.1063/1.4918691
关键词: Magnetic circular dichroism 、 Magnetic field 、 Condensed matter physics 、 Microscope 、 X-ray magnetic circular dichroism 、 Anisotropy 、 Microscopy 、 Magnetization 、 Materials science 、 Magnetic moment
摘要: The spectroscopic analysis of X-ray magnetic circular dichroism (XMCD), which serves as strong and element-specific contrast in full-field transmission soft x-ray microscopy, is shown to provide information on the local distribution spin (S) orbital (L) moments down a spatial resolution 25 nm limited by optics used microscope. spatially resolved L/S ratio observed multilayered (Co 0.3 nm/Pt 0.5 nm) × 30 thin film exhibiting perpendicular anisotropy decreases significantly vicinity domain walls, indicating non-uniform configuration vertical profile wall across film. Quantitative XMCD mapping with spectro-microscopy will become an important characterization tool for systems topological or engineered magnetization inhomogeneities.