Noncontact AFM and differential reflectance spectroscopy joint analyses of bis-pyrenyl thin films on bulk insulators: Relationship between structural and optical properties

作者: Franck Bocquet , Laurent Nony , Franck Para , Philipda Luangprasert , Jean-Valère Naubron

DOI: 10.1103/PHYSREVB.97.235434

关键词: Chemical physicsAnisotropySpectral lineThin filmSpectroscopyAdsorptionAlkali metalMaterials scienceHalideMolecule

摘要: The combined characterization of structural and optical properties organic interfaces adsorbed on inorganic solid substrates down to the molecular scale is crucial from a fundamental point view, but also if one tackles efficient applied devices. In this work, set joint analyses self-assemblies $\ensuremath{\pi}$-conjugated bis-pyrene derivatives upon adsorption two alkali halides bulk insulators reported. analysis performed by means noncontact atomic force microscopy in ultrahigh vacuum either at room or liquid-nitrogen temperature with resolution. surface coverage ranges submonolayer (ML) regime up 5 ML. situ spectroscopy differential reflectance (DR) spectroscopy. A thorough fitting methodology DR spectra allows us derive complete dielectric function adlayers treated an anisotropic formalism, albeit restricted uniaxial approximation. Conclusions regarding process condensation molecules into H aggregates its early stages phase are drawn. This work highlights three main reasons bridge high-resolution layers, which all towards necessity constrain process, namely, (i) characterizing growth mode molecules, (ii) identifying order resulting assemblies, (iii) discriminating their constitutive phases resolution imaging.

参考文章(91)
Sebastian Reineke, Michael Thomschke, Björn Lüssem, Karl Leo, White organic light-emitting diodes: Status and perspective Reviews of Modern Physics. ,vol. 85, pp. 1245- 1293 ,(2013) , 10.1103/REVMODPHYS.85.1245
D. E. Aspnes, Above-bandgap optical anisotropies in cubic semiconductors: A visible–near ultraviolet probe of surfaces Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. ,vol. 3, pp. 1498- 1506 ,(1985) , 10.1116/1.582974
A. Eisfeld, J.S. Briggs, The J- and H-bands of organic dye aggregates Chemical Physics. ,vol. 324, pp. 376- 384 ,(2006) , 10.1016/J.CHEMPHYS.2005.11.015
L. Gross, F. Mohn, N. Moll, P. Liljeroth, G. Meyer, The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy Science. ,vol. 325, pp. 1110- 1114 ,(2009) , 10.1126/SCIENCE.1176210
D. G. de Oteyza, P. Gorman, Y.-C. Chen, S. Wickenburg, A. Riss, D. J. Mowbray, G. Etkin, Z. Pedramrazi, H.-Z. Tsai, A. Rubio, M. F. Crommie, F. R. Fischer, Direct Imaging of Covalent Bond Structure in Single-Molecule Chemical Reactions Science. ,vol. 340, pp. 1434- 1437 ,(2013) , 10.1126/SCIENCE.1238187
A. Massé, R. Coehoorn, P. A. Bobbert, Universal Size-Dependent Conductance Fluctuations in Disordered Organic Semiconductors Physical Review Letters. ,vol. 113, pp. 116604- ,(2014) , 10.1103/PHYSREVLETT.113.116604
Colleen M. Byron, T. C. Werner, Experiments in synchronous fluorescence spectroscopy for the undergraduate instrumental chemistry course Journal of Chemical Education. ,vol. 68, pp. 433- ,(1991) , 10.1021/ED068P433
M. I. Alonso, M. Garriga, F. Alsina, S. Piñol, Determination of the dielectric tensor in anisotropic materials Applied Physics Letters. ,vol. 67, pp. 596- 598 ,(1995) , 10.1063/1.115400
Holger Proehl, Robert Nitsche, Thomas Dienel, Karl Leo, Torsten Fritz, In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different substrates Physical Review B. ,vol. 71, pp. 165207- ,(2005) , 10.1103/PHYSREVB.71.165207
Clemens Barth, Claude R. Henry, Surface double layer on (001) surfaces of alkali halide crystals: a scanning force microscopy study. Physical Review Letters. ,vol. 98, pp. 136804- ,(2007) , 10.1103/PHYSREVLETT.98.136804