Analysis of highly resolved x‐ray photoelectron Cr 2p spectra obtained with a Cr2O3 powder sample prepared with adhesive tape
作者： Ercan Ünveren , E Kemnitz , S Hutton , Andreas Lippitz , WES Unger
DOI: 10.1002/SIA.1655
关键词: Multiplet 、 X-ray 、 Spectral line 、 X-ray photoelectron spectroscopy 、 Resolution (electron density) 、 Chemistry 、 Adhesive 、 Spectrometer 、 Analytical chemistry 、 Spin (physics)
摘要: By using modern XPS systems it is possible to obtain spectra with well-resolved spin orbit, multiplet and field splitting even powder samples mounted adhesive tape. Measurement of Cr2O3 the latest generation spectrometers, which are able analyse non-conductive powders ultimate energy resolution, revealed features satellite emission in Cr 2p spectrum. Therefore, peak-fit analysis Cr(III) compounds requires a more appropriate approach common practice has be reconsidered. One way this spectrum proposed, based on experimental theoretical work other authors. Copyright © 2004 John Wiley & Sons, Ltd.
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