Direct observation of magnetization switching in focused-ion-beam-fabricated magnetic nanotubes
作者： Sakhrat Khizroev , Mark H. Kryder , Dmitri Litvinov , David A. Thompson
DOI: 10.1063/1.1508164
关键词: Solid-state physics 、 Optoelectronics 、 Focused ion beam 、 Remanence 、 Magnetic force microscope 、 Ferromagnetism 、 Materials science 、 Magnetization 、 Nanotube 、 Microscopy 、 Nanotechnology
摘要: In this letter, a direct measurement of “easy” magnetization switching indicating zero-magnetization remanence in magnetic probe with cross section as narrow 60×60 nm2, and tall 750 nm, is presented. Magnetic force microscopy was utilized to test focused-ion-beam-fabricated nanomagnetic probes. The data directly indicate that unlike regular solid probe, tubelike ending (nanotube) provides substantially “easier” switching.
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