An analytical subthreshold current model for ferroelectric SiGe-on-insulator field effect transistor (FSGOIFET)

作者: Monika Bansal , Harsupreet Kaur

DOI: 10.1088/1361-6641/AAF2E6

关键词: Device parametersDrain-induced barrier loweringOptoelectronicsSubthreshold conductionMaterials scienceField-effect transistorInsulator (electricity)Threshold voltageSubthreshold swingFerroelectricity

摘要: In this paper, a novel device concept has been presented which integrates ferroelectric gate insulator on SiGe-On-insulator (SGOI) substrate. An analytical subthreshold current model for SGOI field effect transistor (FSGOIFET) developed by using 2D Poisson's equation and Landau–Khalatnikov equation. The explicit expressions threshold voltage have obtained extending the electrostatic potential model. other important parameters such as drain induced barrier lowering, roll-off, swing etc to quantitatively study performance of FSGOIFET at shorter channel length. merits demonstrated comparing all characteristics with those SGOIFET. excellent fit results simulation from Silvaco ATLAS TCAD corroborated accuracy

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