Identification of insect-damaged wheat kernels using short-wave near-infrared hyperspectral and digital colour imaging

作者: Chandra B. Singh , Digvir S. Jayas , Jitendra Paliwal , Noel D.G. White

DOI: 10.1016/J.COMPAG.2010.06.001

关键词: Mahalanobis distanceRed flour beetleDigital imageSitophilusMathematicsPattern recognitionHyperspectral imagingComputer visionHistogramQuadratic classifierArtificial intelligenceRice weevil

摘要: … The results of this study indicated that NIR image features combined with colour image features have the potential of detecting insect-damaged kernels in wheat samples with very high …

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