A Capacitance Standard Based on Counting Electrons
作者： Mark W Keller , Ali L Eichenberger , John M Martinis , Neil M Zimmerman
DOI: 10.1126/SCIENCE.285.5434.1706
关键词: Differential capacitance 、 Electron 、 Atomic physics 、 Quantum tunnelling 、 Quantum Hall effect 、 Chemistry 、 Josephson effect 、 Capacitance 、 Diffusion capacitance 、 Capacitor 、 Multidisciplinary
摘要: A capacitance standard based directly on the definition of was built. Single-electron tunneling devices were used to place N electrons charge e onto a cryogenic capacitor C, and resulting voltage change ΔV measured. Repeated measurements ofC = Ne/ΔV with this method have relative deviation 0.3 × 10–6. This offers natural basis for analogous Josephson effect quantum Hall resistance.
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