Interferential position measuring device with three detectors

作者: Walter Huber , Dieter Michel

DOI:

关键词: OptoelectronicsLight beamMeasuring instrumentPhysicsPhotodetectorDetectorPosition (vector)OpticsDiffraction

摘要: An optical device, such as a position measuring instrument, having source of light and diffraction element for receiving the light, creating partial beams which interfere with one another, producing from interfering first beam projecting along direction second direction. The device further includes positioned to receive focused light. Furthermore, has photodetector detect