Analysis of Fin-Line Discontinuities

作者: Hadia El Hennawy , Klaus Schunemann

DOI: 10.1109/EUMA.1979.332745

关键词: STRIPSElectrical impedanceClassification of discontinuitiesFin (extended surface)Capacitive sensingOpticsPhysicsLine (geometry)Equivalent circuitDiode

摘要: Various discontinuities in the slot width of fin-lines are accurately analysed. These include a step width, an inductive notch, small capacitive strip, and longitudinal stripe for mounting semiconductor diode. Equivalent circuits derived related to geometrical parameters. The results can directly be applied design impedance transforming filter networks.

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