作者: Guoqiang Xiang , Bin Hu , Zucheng Jiang , Chuqing Gong
DOI: 10.1002/JMS.1111
关键词: Particle size 、 Detection limit 、 Vaporization 、 Titanium dioxide 、 Impurity 、 Chemistry 、 Slurry 、 Particle 、 Analytical chemistry 、 Inductively coupled plasma mass spectrometry
摘要: A comparison of slurry sampling (SS)-ETV-ICP-MS and nebulization (SN)-ICP-MS for direct determination trace impurities in titanium dioxide powder is made. The particle size effect, matrix effect analytical characteristics SSETV-ICP-MS SN-ICP-MS are compared. results have shown that has a lower compared to SN-ICP-MS. performance the two methods reveals similar relative detection limits (in nanogram per liter level); however, former absolute limit than latter. Although precision little worse SN-ICP-MS, it still acceptable real sample analysis. were successfully applied samples with sizes less 50 nm, but only could be 1 µm. Copyright © 2006 John Wiley & Sons, Ltd.