作者: L.T. Weng , C. Poleunis , P. Bertrand , V. Carlier , M. Sclavons
关键词: Materials science 、 Analytical chemistry 、 Amine gas treating 、 X-ray photoelectron spectroscopy 、 Functional group 、 Extraction (chemistry) 、 Trimellitic anhydride 、 Inorganic chemistry 、 Silicone 、 Surface modification 、 Secondary ion mass spectrometry
摘要: Time-of-flight secondary ion mass spectrometry (TOF SIMS) and X-ray photoelectron spectroscopy (XPS) have been jointly used to study a two-step surface processing of AS4 carbon fiber: extraction sizing in CH2Cl2 functionalization with trimellitic anhydride. The combined information on molecular specificity obtained TOF SIMS quantification XPS allows us follow qualitatively quantitatively the changes functional groups surface. results show that contains at least four different compounds. These compounds can be extracted elimination is almost complete for silicone. anhydride has realized. reaction takes place between amine fiber two types