XPS Study on the Oxidation of InSe

作者: Izumi Miyake , Toyokazu Tanpo , Chiei Tatsuyama

DOI: 10.1143/JJAP.23.172

关键词: PhotochemistryOxygenX-ray photoelectron spectroscopyPhotovoltaic effectHeterojunctionSemiconductorVisible spectrumChemistryIon sputteringThermal oxidation

摘要: … O ls spectrum of RT-InSe (d)consists of more oxidation states than that of p-InSe. The In, O, component (a Gaussian at 529.8 eV with FWHM 1.6 eV… ) of the O ls spectrum between p-In O, …

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