Field-emission sites on unpolished stainless steel
作者： B M Cox , W T Williams
DOI: 10.1088/0022-3727/10/3/001
关键词: Tracking (particle physics) 、 Field electron emission 、 Scanning electron microscope 、 Analytical chemistry 、 Environmental scanning electron microscope 、 Electron beam-induced deposition 、 Materials science 、 Electron 、 Electron microscope 、 Optics 、 Electric field
摘要: An electron-beam tracking technique has been used to locate the sources of field-emitted electrons for subsequent in situ examination with a scanning electron microscope. The electrical characteristics individual emitters were measured and estimate their physical size assuming simple geometric models. Micrographs two locations are shown both before after application an electric field sufficiently large destroy emission source.
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