Molecular heterojunction morphology on rough substrate surfaces: component separation by Fourier subtraction.

摘要: The study of molecular heterojunction morphology is often complicated by the presence a topographically complex substrate. On such substrates, it difficult to definitively assign topographic feature specific component. We propose technique, based on separation features in reciprocal space (Fourier subtraction), deconvolute surface into two real images. technique has been successfully applied three classes systems: (1) where overlayer are smaller than those substrate, as with small molecule growth polymer substrates (DIP/PEDOT:PSS); (2) larger film contact corrugated metal (P3HT/Al), and (3) both substrate same size. Fourier subtraction method extends heterojunctions realistic topography may previously have prevented basic description each component film.