作者: Robert H. Berg , George Bakalyar
DOI:
关键词: Sample (graphics) 、 Yield (chemistry) 、 Statistics 、 Computational physics 、 Binary number 、 Coincidence 、 Particle 、 Measure (physics) 、 Mathematics
摘要: A method of correcting first approximation data obtained from a conventional electrozone particle sensing apparatus includes steps for calculating factors binary and tertiary coincidences, the raw physical characteristics equipment, to yield an accurate measure distribution within sample.