Spectroscopic ellipsometry of electrochemically prepared thin film polyaniline
作者： H.A Al-Attar , Q.H Al-Alawina , A.P Monkman
DOI: 10.1016/S0040-6090(03)00279-7
关键词: Analytical chemistry 、 Materials science 、 Condensed matter physics 、 Valence (chemistry) 、 Anisotropy 、 Polyaniline nanofibers 、 Polyaniline 、 Thin film 、 Electronic band structure 、 Polaron 、 Ellipsometry
摘要: We report on UV-visible-near IR spectroscopic ellipsometry of electrochemically prepared polyaniline.Accurate modeling and fitting to experimental data can only be obtained very thin samples (-30 nm).Samples with thickness greater than 100 nm exhibit complicated characteristics due absorption effects as well complex structural such anisotropy, graded other ambiguous factors. A Lorentz model, three oscillators centered at approximately 1.5, 2.8 3.6 eV a free carrier contribution, according the model defect states in polyaniline proposed by McCall et al. wPhys.Rev.B 41 (1990) 5202x give reasonable fit for thinnest sample.The central transitions correspond from valence hole polaron, occupied polaron level conduction band (p™p*), respectively.These also best thick despite large mean square error value because aL)1 complexity.The films may appear possess uniaxial anisotropy multilayer structure different growth stages rigidity polymer chain.
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