作者: A. Rodriguez , M.E. Sánchez-Vergara , V. García-Montalvo , A. Ortiz-Rebollo , J.R. Alvarez-Bada
DOI: 10.1016/J.SAA.2009.11.013
关键词: Thin film 、 Fourier transform infrared spectroscopy 、 Copper 、 Infrared spectroscopy 、 Ellipsometry 、 Crystalline silicon 、 Chemistry 、 Analytical chemistry 、 Nickel 、 Spectroscopy
摘要: Abstract Semiconducting molecular-material thin-films of tetrabenzo (b,f,j,n) {1,5,9,13} tetraazacyclohexadecine copper(II) and nickel(II) bisanthraflavates have been prepared by using vacuum thermal evaporation on Corning glass substrates crystalline silicon wafers. The films thus obtained were characterized infrared spectroscopy (FTIR), atomic force microscopy (AFM), ultraviolet–visible (UV–vis) ellipsometry. IR showed that the exhibit same intra-molecular bonds as original compounds, which suggests process does not significantly alter their bonds. optical band-gap values calculated from absorption coefficient may be related to non-direct electronic interband transitions. effect temperature conductivity was also measured in these samples. It found temperature-dependent electric current is always higher for nickel-based material a semiconductor-like behavior with conductivities order 10−8 Ω−1 cm−1.