Modelling phase imperfections in compound refractive lenses.

摘要: A framework based on physical optics for simulating the effect of imperfect compound refractive lenses (CRLs) upon an X-ray beam is described, taking into account measured phase errors obtained from at-wavelength metrology. CRL stack modelled, with increasing complexity, as a single thin element, then more realistic element including absorption and thickness effects, finally adding optical imperfections to CRL. Coherent partially coherent simulations using Synchrotron Radiation Workshop (SRW) are used evaluate different models, effects check validity design equations suitability of the figures merit.