作者: V. Mocella , Y. Epelboin , J. P. Guigay , J. Härtwig
DOI: 10.1107/S0108767301006985
关键词: Physics 、 Crystallographic defect 、 Refractive index 、 Diffraction 、 Field (physics) 、 Refractometry 、 Plane wave 、 Phase (waves) 、 Optics 、 X-ray crystallography
摘要: In a previous paper, the concept of locally plane wave was explained theoretically. such configuration, fringe pattern recorded on film can be considered as phase analyser. Here experimental analysis is presented, showing examples interesting applications to X-ray refractometry and visualization strain field around isolated defects.