Applications of dynamical diffraction under locally plane wave conditions : defects in nearly perfect crystals and x-ray refractometry.

作者: V. Mocella , Y. Epelboin , J. P. Guigay , J. Härtwig

DOI: 10.1107/S0108767301006985

关键词: PhysicsCrystallographic defectRefractive indexDiffractionField (physics)RefractometryPlane wavePhase (waves)OpticsX-ray crystallography

摘要: In a previous paper, the concept of locally plane wave was explained theoretically. such configuration, fringe pattern recorded on film can be considered as phase analyser. Here experimental analysis is presented, showing examples interesting applications to X-ray refractometry and visualization strain field around isolated defects.

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