作者: D. Liakin , D. Seleznev , A. Orlov , R. Kuibeda , G. Kropachev
DOI: 10.1063/1.3267293
关键词: Test bench 、 Beam (structure) 、 Beam emittance 、 Scintillator 、 Ion beam 、 Optics 、 Measuring instrument 、 Thermal emittance 、 Particle accelerator 、 Materials science
摘要: In Institute for Theoretical and Experimental Physics (ITEP) the portable emittance measurements device is developed. It provides both with “pepper-pot” “two slits” methods. Depending on method of measurements, either slits or pepper-pot mask scintillator are mounted two activators installed in standard Balzer's cross chamber CF-100 flanges. To match angle resolution measured beam, length stainless steel pipe between crosses changes adjusted. The description results at ITEP ion source test bench presented.