Test and Testable Design
DOI: 10.1007/978-3-642-57199-2_4
关键词: Integrated circuit 、 Sequential logic 、 Reliability engineering 、 Fault coverage 、 Process (computing) 、 Test (assessment) 、 Fabrication 、 Computer science 、 Linear feedback shift register
摘要: Defects may occur during the fabrication process and lifetime of integrated circuits. Integrating a faulty device into systems will result in expensive repairs or even unsafe situations should be avoided by testing chips
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sci-hub.st 参考文章(106)
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