Electron fluctuation induced resonance broadening in nano electromechanical systems: the origin of shear force in vacuum.
作者： A. Siria , T. Barois , K. Vilella , S. Perisanu , A. Ayari
DOI: 10.1021/NL301618P
关键词: Dissipation 、 Materials science 、 Electron 、 Resonance 、 Sense (electronics) 、 Nano- 、 Shear force 、 Condensed matter physics 、 Nanowire 、 Mechanical resonance
摘要: This article presents a study of the poorly understood “shear-force” used in an important class near-field instruments that use mechanical resonance feedback detection. In case metallic probe near surface vacuum, we show 10–60 nm range there is no such thing as shear-force sense nonconservative friction force. Fluctuations oscillator frequency, likely induced by local charge variations, could account for reported effects literature without introducing dissipative
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