Calculation of dielectric strength of the SF/sub 6//N/sub 2/ gas mixture in macroscopically and microscopically non-uniform fields
作者： Y. Qiu , Y.P. Feng
DOI: 10.1109/ICPADM.1994.413934
关键词: Nitrogen 、 Curvature 、 Dielectric strength 、 Surface roughness 、 Coaxial 、 Ionization 、 Chemistry 、 Analytical chemistry 、 Concentric 、 Electrode
摘要: Dielectric strength of the SF/sub 6//N/sub 2/ gas mixture in a uniform field can be calculated using simple method assuming there is no interaction between different component molecules. However, to calculate dielectric practical gas-insulated system, both electrode curvature factor and surface roughness should taken into account. This paper presents factors for coaxial system concentric spherical reports effect on breakdown mixture. >
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