作者: SQ Zhang , WL Li , LD Wang , N Li , WD Fei
DOI: 10.1016/J.APSUSC.2010.11.168
关键词: Lanthanum 、 Dielectric 、 Nuclear magnetic resonance 、 Ferroelectricity 、 Tetragonal crystal system 、 Coercivity 、 Ceramic 、 Thin film 、 Sol-gel 、 Materials science 、 Analytical chemistry
摘要: Abstract Effects of lanthanum (La) substitution (0.003 ≤ x ≤ 0.015) on the dielectric and ferroelectric properties Pb(Zr0.5Ti0.5)O3 thin films have been investigated. The were synthesized Pt (1 1 1)/Ti/SiO2/Si (1 0 0) substrates by a sol–gel method. Large constants are obtained within range 800–1600 which almost comparable to those observed in bulk ceramics. also show improved remnant polarization values reduced coercive field with increasing addition La substitution. Our results suggest that low contributes enhance film electric due improvement non-180° domain wall mobility as well stabilization tetragonal phase.