作者: R. Stepniewski , J. Binder , A. Wysmolek , J. M. Urban , W. Strupinski
DOI: 10.1088/0957-4484/27/4/045704
关键词: Graphene 、 Analytical chemistry 、 D band 、 Optoelectronics 、 Bilayer graphene 、 Raman spectroscopy 、 Fermi level 、 Coherent anti-Stokes Raman spectroscopy 、 Materials science 、 Field-effect transistor 、 Capacitance
摘要: We present a novel measurement approach which combines the electrical characterization of solution-gated field effect transistors based on epitaxial bilayer graphene 4H-SiC (0001) with simultaneous Raman spectroscopy. By changing gate voltage, we observed signatures related to resonant electron-phonon coupling. An analysis these bands enabled extraction geometrical capacitance system and an accurate calculation Fermi levels for graphene. intentional application higher voltages allowed us trigger electrochemical reactions, followed in-situ by The reactions showed partially reversible character, as indicated emergence / disappearance peaks assigned C-H Si-H vibration modes well increase decrease defect-related D band intensity. Our setup provides highly interesting platform future spectroelectrochemical research electrically induced sorption processes micrometer scale.