Synthesis and Characterization of Mo–Nb Films Superconducting at 100–200 mK
作者： V. Yefremenko , J. Zhang , M. Lisovenko , P. Barry , A. Bender
DOI: 10.1007/S10909-019-02258-8
关键词: Scanning electron microscope 、 Diffraction 、 Crystal 、 Crystallite 、 Deposition (law) 、 Superconductivity 、 Analytical chemistry 、 Solid solution 、 Microstructure 、 Materials science
摘要: We have developed a new transition-edge sensor material with critical temperature (Tc) in the range 100–200 mK. The is solid solution of two superconducting components, MoxNb1−x, co-sputtered from high-purity single-component targets (Mo and Nb). Tc has minimum (dTc/dx = 0) at an intermediate concentration components. optimized deposition parameters composition to provide films sharp transition ~ 150 mK. investigated structural features surface morphology using X-ray diffraction (XRD) scanning electron microscopy. XRD measurements indicate that grown are polycrystalline, preferred orientation along (110) crystal direction clear correlation between properties film microstructure.
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