One-Port De-Embedding Technique for the Quasi-Optical Characterization of Integrated Components

摘要: We describe a one-port de-embedding technique suitable for the quasi-optical characterization of terahertz integrated components at frequencies beyond operational range most vector network analyzers. This is also when manufacturing precision terminations to sufficiently fine tolerances application TRL not possible. The based on reflection measurements series easily realizable test pieces. A theoretical analysis presented implemented using null-balanced bridge reflectometer. takes into account quantization effects in linear and angular encoders associated with balancing procedure, as well source power detector noise equivalent power. measuring waveguide characteristic impedance attenuation this further analyzed after taking changes coupled due axial, rotational, lateral alignment errors between device under instruments' port. propagation assuming imperfect coupling two fundamental Gaussian beams. required repositioning samples test-port discussed. Quasi-optical process WR-8 adjustable short 125 GHz are presented. methodology may be extended allow determination S-parameters arbitrary two-port junctions. measurement proposed should prove useful above 325 where there lack standards.