Comment on "Free Migration of Interstitials in Tungsten"
作者： D. N. Seidman , K. L. Wilson , C. H. Nielsen
DOI: 10.1103/PHYSREVLETT.35.1041
关键词: Carbon 、 Doping 、 Analytical chemistry 、 Materials science 、 Tungsten 、 Ion microscopy 、 Field ion microscope 、 Rhenium 、 Atom 、 Field (physics)
摘要: Results are briefly summarized of an extensive series recent field- ion microscope experiments on ion-irradiated (20-and 30-keV W$sup +$) tungsten (with residual resistance ratios varying from 5 x 10$sup 4$ to 5), specifically doped with carbon, and tungsten--0.5-at. percent- 3-at. rhenium alloys. The all consistent the long-range migration a self-interstitial atom occurring at approximately 38$sup 0$K. This result is contrasted conclusions Okuda Mizubayashi.
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