Technique for providing loopback testing with single stage equalizer
作者： Sangeeta Raman , Tim Tri Hoang
DOI:
关键词: Loopback 、 Electronic engineering 、 Signal 、 Voltage 、 Integrated circuit 、 Capacitive coupling 、 Single stage 、 Equalizer 、 Node (circuits) 、 Engineering
摘要: Devices and methods for serial loopback testing in an integrated circuit (IC) are provided. To implement testing, equalizer stage of a receiver the IC is powered down. In addition, common-mode voltage reduced and/or bulk node connected to ground. Doing so may reduce impact capacitive coupling from input pins buffer, thereby improving quality output signal.
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