作者: Sawanta S. Mali , Bharmana M. Patil , Chirayath A. Betty , Popatrao N. Bhosale , Young Woo Oh
DOI: 10.1016/J.ELECTACTA.2012.01.079
关键词: Layer (electronics) 、 X-ray photoelectron spectroscopy 、 Tin oxide 、 Kesterite 、 Chemistry 、 Ionic bonding 、 Thin film 、 Analytical chemistry 、 CZTS 、 Photoelectrochemistry
摘要: Novel nanoflakes of Cu2ZnSnS4 (CZTS) thin film were directly deposited on fluorine doped tin oxide (FTO)-coated glass substrates by the successive ionic layer adsorption and reaction (SILAR) method. The results energy dispersive X-ray spectroscopy (EDX) indicate that these CZTS films are Cu rich S poor. combination diffraction (XRD) Fourier Transform-Raman (FT-Raman) reveal exhibit a strong preferential orientation flakes along [1 1 2] direction small Cu2−xS phase exists in films. Photoelectrochemical characterization revealed p-type photo-response when illuminated an aqueous Eu3+ redox electrolyte. total conversion power cell is 1.85% under 30 mW/cm2 illumination.