作者: Leszek Bychto , Mirosław Maliński , Aleksy Patryn , Mikhail Tivanov , Valery Gremenok
DOI: 10.1016/J.OPTMAT.2018.03.043
关键词: Amplitude 、 Thin film 、 Photoacoustic spectroscopy 、 Band gap 、 Spectral line 、 Semiconductor 、 Photoacoustic imaging in biomedicine 、 Thin layers 、 Analytical chemistry 、 Materials science
摘要: Abstract This paper presents a new method for computations of the optical absorption coefficient spectra from normalized photoacoustic amplitude thin semiconductor samples deposited on optically transparent and thermally thick substrates. was tested CuIn(Te0.7Se0.3)2 films. From spectra, were computed with formula as also numerical iterative method. these value energy gap film material type transitions determined. experimental transmission too, compared obtained spectra.