A study of the electronic and physical properties of SnO2 thin films as a function of substrate temperature
作者： O. Erken , O.M. Ozkendir , M. Gunes , E. Harputlu , C. Ulutas
DOI: 10.1016/J.CERAMINT.2019.06.153
关键词: Thin film 、 Crystal structure 、 X-ray absorption fine structure 、 Tetragonal crystal system 、 Materials science 、 Absorption spectroscopy 、 Extended X-ray absorption fine structure 、 X-ray absorption spectroscopy 、 Tin dioxide 、 Analytical chemistry
摘要: Abstract In this work, tin dioxide (SnO2) thin films were prepared at various substrate temperatures (380–440 °C, in steps of 20 °C) on glass substrates by the Spray Pyrolysis Method. X-ray Diffraction (XRD) measurements revealed that SnO2 formed a tetragonal crystallized structure. The electronic structure several investigated with collected Absorption Spectroscopy (XAS) data. crystal analysis was also supported Extended Fine Structure (EXAFS) data extracted from (XAFS) Unstable behaviors detected samples due to metastable SnO formations as result phase transitions during annealing processes. Clear information atomic displacements picture mechanism obtained EXAFS found exhibit high transmittance (average 90%) 400–1100 nm interval. thickness film (t) and refractive index (n) calculated spectra visible region using envelope method. direct energy band gaps 4.01–4.09 eV. Atomic force microscope (AFM) performed order investigate surface roughness films.
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