作者: M. Kumar , V. Gupta , G.N. DeBrabander , P. Chen , I.T. Boyd
DOI: 10.1109/68.212691
关键词: Materials science 、 Microprobe 、 Gallium arsenide 、 Raman spectroscopy 、 Optoelectronics 、 Ion implantation 、 Mixing (physics) 、 Optics 、 Waveguide (optics) 、 Focused ion beam 、 Spectral line
摘要: Optical channel waveguiding in a AlGaAs multiple-quantum-well structure was demonstrated formed by compositional mixing induced focused ion beam (FIB) implantation. Selective achieved FIB implanting Si/sup ++/ with dose of 5*10/sup 14/ cm/sup -2/ followed rapid thermal annealing at 950 degrees C for 10 s. Raman microprobe spectra were used to characterize the lateral variation mixing. Channel waveguide loss 17.2 dB/cm measured, compared 10-12 measured planar waveguiding. Mode field pattern measurements indicate that change effective index 2.7*10/sup -4/ induced, corresponding an approximate depth 270 nm. >