Optical channel waveguides in AlGaAs multiple-quantum-well structures formed by focused ion-beam-induced compositional mixing

作者: M. Kumar , V. Gupta , G.N. DeBrabander , P. Chen , I.T. Boyd

DOI: 10.1109/68.212691

关键词: Materials scienceMicroprobeGallium arsenideRaman spectroscopyOptoelectronicsIon implantationMixing (physics)OpticsWaveguide (optics)Focused ion beamSpectral line

摘要: Optical channel waveguiding in a AlGaAs multiple-quantum-well structure was demonstrated formed by compositional mixing induced focused ion beam (FIB) implantation. Selective achieved FIB implanting Si/sup ++/ with dose of 5*10/sup 14/ cm/sup -2/ followed rapid thermal annealing at 950 degrees C for 10 s. Raman microprobe spectra were used to characterize the lateral variation mixing. Channel waveguide loss 17.2 dB/cm measured, compared 10-12 measured planar waveguiding. Mode field pattern measurements indicate that change effective index 2.7*10/sup -4/ induced, corresponding an approximate depth 270 nm. >

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