作者: Anjali Paravannoor , R Ranjusha , AM Asha , R Vani , Sujith Kalluri
DOI: 10.1016/J.CEJ.2013.01.063
关键词: Transmission electron microscopy 、 Nanotechnology 、 Non-blocking I/O 、 Thin film 、 Chemical engineering 、 Materials science 、 Nanowire 、 Cyclic voltammetry 、 Capacitance 、 Selected area diffraction 、 BET theory
摘要: … were of high purity cubic NiO phase. Selected area electron … of NiO nanowires in (1 0 0), while exhibiting an average diameter of ∼ 65 nm. BET analysis showed these nanowires …