A TEM study on the formation of stacking faults by consecutive irradiation of energetic electrons in the Ca-doped YBCO system

作者: C C Lam , G J Shen , C L Fu , K C Hung

DOI: 10.1088/0953-2048/10/11/003

关键词: Condensed matter physicsCrystalSuperconductivityHigh-temperature superconductivityStacking faultTransmission electron microscopyCrystallographic defectMaterials scienceDopingStacking

摘要: Stacking faults existing in the Ca-doped YBCO ceramic superconductors have been investigated by means of transmission electron microscopy (TEM). Irradiation with an energetic beam leads to formation stacking faults. The lie on crystal planes, and stretch along two different directions, . A model fault is proposed interpret observed characteristic structure this lattice defect. energy has also crudely estimated using model.

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