Effect of RuCoCr-oxide intermediate layers on the growth, microstructure, and recording performance of CoCrPt–SiO2 perpendicular recording media

作者: Kumar Srinivasan , S. N. Piramanayagam , Yew Seng Kay

DOI: 10.1063/1.3294696

关键词: Grain sizeCoercivitySputter depositionPerpendicular recordingComposite materialSputteringMicrostructureMetallurgyGrain boundaryMaterials scienceTexture (crystalline)

摘要: The crystallographic growth, magnetic properties, microstructure, and recording performance of CoCrPt–SiO2 perpendicular media on RuCoCr type intermediate layers were systematically investigated. Excellent Co (00•2) texture with dispersion Δθ50 as low 3.2° could be obtained the grain isolation layer, whereas pure Ru layer was 3.9°. Upon injecting oxygen into via reactive sputtering at high sputter pressures, center-to-center distance small 5.9 nm a distribution about 13% achieved. deteriorated RuCoCr-oxide layers, however, it remained comparable to that layers. Signal-to-noise ratio also increased due decreased sizes. effectiveness toward size reduction in improving magnet...

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