作者: Kumar Srinivasan , S. N. Piramanayagam , Yew Seng Kay
DOI: 10.1063/1.3294696
关键词: Grain size 、 Coercivity 、 Sputter deposition 、 Perpendicular recording 、 Composite material 、 Sputtering 、 Microstructure 、 Metallurgy 、 Grain boundary 、 Materials science 、 Texture (crystalline)
摘要: The crystallographic growth, magnetic properties, microstructure, and recording performance of CoCrPt–SiO2 perpendicular media on RuCoCr type intermediate layers were systematically investigated. Excellent Co (00•2) texture with dispersion Δθ50 as low 3.2° could be obtained the grain isolation layer, whereas pure Ru layer was 3.9°. Upon injecting oxygen into via reactive sputtering at high sputter pressures, center-to-center distance small 5.9 nm a distribution about 13% achieved. deteriorated RuCoCr-oxide layers, however, it remained comparable to that layers. Signal-to-noise ratio also increased due decreased sizes. effectiveness toward size reduction in improving magnet...