作者: A.K. Tagantsev , V.O. Sherman , K.F. Astafiev , J. Venkatesh , N. Setter
DOI: 10.1023/B:JECR.0000015661.81386.E6
关键词: Microwave 、 Optoelectronics 、 Dielectric 、 Thin film 、 Ferroelectricity 、 Materials science 、 Composite number 、 Dielectric loss 、 Characterization (materials science) 、 Chemical vapor deposition
摘要: A review of the properties of ferroelectric materials that are relevant to microwave tunable devices is presented: we discuss the theory of dielectric response of tunable bulk materials …