Production of projectile and targetK X-rays by single and multiple electron-capture in collisions of Si14+ and Si13+ ions with argon atoms at 4.5 and 5.5 MeV/amu

摘要: Projectile and target X-ray cross-sections have been measured in collisions of bare hydrogenlike Silicon ions with argon atoms. energies are 125 MeV 153 MeV, i.e. the intermediate velocity region forK-shell capture. Coincidence measurements between photons scattered Sin+ projectiles charge statesn-1,n-2 andn-3 made. The relative contribution exchange direct ionization (or excitation) targetK-shell has obtained directly by this new method. DoubleK-shell electron transfer is demonstrated to be very large case fully stripped Si ions. A thorough theoretical analysis data carried out multiple capture processes evaluated using an independent model.