作者: Husam H. Abu-Safe , Marouf Hossain , Hameed Naseem , William Brown , Abdullah Al-Dhafiri
DOI: 10.1007/S11664-004-0282-8
关键词: Thin film 、 Crystallographic defect 、 Doping 、 Analytical chemistry 、 Chemistry 、 Crystallite 、 Annealing (metallurgy) 、 Mineralogy 、 Electrical resistivity and conductivity 、 Electron mobility 、 Grain size
摘要: The CdS:Cl thin films have been prepared using thermally evaporated, CdCl2-mixed CdS powder at 200°C substrate temperature. percentage of CdCl2 in the mixture varied from 0% to 0.20%. electrical properties and grain size deposited were investigated. results show that light doping, resistivity, carrier concentration, mobility follow Seto’s model for polycrystalline material. However, with heavy these undergo a saturation trend. behavior can be understood terms rapid formation A-center complexes films. annealed 250°C 300°C. resistivity pure lightly doped increased annealing temperature, whereas concentration decreased. higher doping concentrations, decreased, showed improvement. These changes are attributed reduction lattice defect sites upon annealing. experimental interpreted modified version materials.