Degradation of instrumentation amplifiers due to the nonionizing energy loss damage
作者： F.J. Franco , J. Lozano , J.P. Santos , J.A. Agapito
关键词: Power bandwidth 、 Direct-coupled amplifier 、 Current sense amplifier 、 Input offset voltage 、 Engineering 、 Transistor array 、 Electrical engineering 、 Amplifier 、 Electronic engineering 、 Operational amplifier 、 Instrumentation amplifier
摘要: Tests on instrumentation amplifiers exposed to neutron radiation have been done. The tested devices were commercial or designed with rad-tol operational amplifiers. results show changes in frequency behavior, gain, offset voltage, output saturation voltages, and quiescent current. tolerance is bigger JFET input stage large bandwidth smaller if the amplifier has for reducing power consumption. IAs built OPAMPs a higher than ones, but they disadvantages: high temperature influence, low CMRR, etc.
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