Excitation of XeI resonance lines in Xe + /Xe collisions

作者: E. Grant Jones

DOI: 10.1103/PHYSREVA.21.1902

关键词: PhysicsCharged particleType (model theory)Atomic physicsProduction (computer science)XenonEnergy (signal processing)ResonanceThreshold energyExcited state

摘要: Symmetric ion-atom reactions in xenon of the type ${\mathrm{Xe}}^{+}$ + Xe\ensuremath{\rightarrow}${\mathrm{Xe}}^{+}$ Xe* have been found to occur with large cross sections at collision energies below 50 eV (c.m.). The reaction section for production two lowest Xe resonance levels $6s{[\frac{3}{2}]}_{1}^{o}$ and $6{s}^{\ensuremath{'}}{[\frac{1}{2}]}_{1}^{o}$ 7-50 measured by monitoring 147.0- 129.6-nm XeI lines. All involving ${\mathrm{Xe}}^{+}(^{2}P_{\frac{3}{2},\frac{1}{2}}^{o})$ impacting ions display kinetic-energy thresholds corresponding transfer more than 11 translational energy into internal energy. Experimental exceed thermochemical difference between reactants products evaluated under infinite separation conditions. Excitation level Xe, $6s{[\frac{3}{2}]}_{1}^{o}$, is depend strongly upon electronic state $^{2}P_{\frac{3}{2}}^{o}$ or $^{2}P_{\frac{1}{2}}^{o}$, reacting ions.

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