Optical Near-Field Spectroscopy

作者: M. Wegener

DOI: 10.1007/978-94-010-0287-5_3

关键词: WavelengthNear and far fieldDiffractionSoft X-ray emission spectroscopyOpticsOptical microscopeOpacityMicroscopePhysicsLens (optics)

摘要: In school, I learned that the wavelength of light limits resolution which one can obtain with an optical microscope. The reason is radiated from structures much smaller than diffracted so it not efficiently collected by microscope lens. Hence information on these small lost, thus limited. believed it. Yet, following simple gedankenexperiment shows this true in general. Forget about lens and consider apparatus (Fig.1). Take a thin film opaque, i.e., transparent, non-reflecting material drill hole into light. Now put directly (no spacing) onto structure to be investigated, e.g. table, shine hole. It clear under conditions reflected stems exclusively table underneath If you now scan over plane obviously image — only determined diameter Under conditions, has nothing do What school wrong.

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