作者: I. Ghinello , G. C. Montanari , L. Gherardi , R. Mele
DOI: 10.1007/BF03185420
关键词: Mechanics 、 Quality (physics) 、 High-temperature superconductivity 、 Probability distribution 、 Weibull distribution 、 Degradation (telecommunications) 、 Materials science
摘要: Specimens of 2223-BSCCO tapes were subjected to mechanical degradation, measuring, after and before the voltage-current (V-I) characteristic. The two-parameter Weibull function was used fit cumulative density probability distributions (obtained fromV-I data by numerical-analytical differentiation). It is shown that Weibull-function parameter values are sensitive weak points generated in stress, thus providing clear evidence presence defects. In particular, attention focused answer diagnostic procedures resorting distribution which can be encountered a HTSC tape typically for high-voltage cables. These defects arise due aging or already present new tape, proposed procedure has both quality control features.