作者: G. Mussi , N. Gisin , R. Passy , J.P. von der Weid
DOI: 10.1049/EL:19960600
关键词: Image resolution 、 Domain (ring theory) 、 High dynamic range 、 Reflectometry 、 Signal 、 Sensitivity (electronics) 、 Materials science 、 Optics 、 Dynamic range 、 Rayleigh scattering
摘要: Optical frequency domain reflectometry (OFDR) measurements with 60 dB dynamics on the 1.55 /spl mu/m Rayleigh backscattering signal 2 cm spatial resolution and 10 m maximum range are presented. A sensitivity of -152.5 is demonstrated, representing highest reported to date using OFDR technique. This level was achieved <3 min total acquisition time.