The Meyer model revisited: why is charge not conserved? (MOS transistor)

作者: M.A. Cirit

DOI: 10.1109/43.39064

关键词: TopologyCapacitive sensingCharge conservationElectronic engineeringEquivalent circuitEngineeringCharge (physics)CapacitanceTransistorElectronic circuit simulationElectric charge

摘要: A new approach to computer simulation of capacitance effects in MOS transistors is presented. It shown that charge nonconservation the result faulty mathematical modeling capacitive nonlinearities SPICE circuit simulator and not intrinsic any specific or model. The correct model described. results simulations using Meyer model, which conserves charge, are given for some test circuits. >

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