作者: R. Wiesendanger
DOI: 10.1016/0169-4332(92)90055-3
关键词: Scale (ratio) 、 Materials science 、 Scanning tunneling microscope 、 Nanotechnology 、 Microscope 、 Fabrication 、 Nanometre 、 Surface modification
摘要: Abstract The application of scanning tunneling microscopy (STM) to the fabrication nanometer scale structures is reviewed. Representative examples are given rather than trying present a complete overview surface modification procedures employed so far. issues writing speed as well ultimate decrease size written features addressed. Nanometer modifications performed with STM-related scanned probe microscopes also described.