Real-time control sequencer with state matrix logic

作者: Michael J. Buehler , Hubert A. Miller , Michael A. Sweeney , Kathleen F. Bonaffini , Sidney F. Rudolph

DOI:

关键词: Process stateState (computer science)Real-time Control SystemProcess (computing)Event (computing)Process controlReal-time computingComputer scienceData processing systemMicrocode

摘要: A high performance, real-time control sequencer is disclosed which incorporates a unique state matrix logic. This performs rapid resolution of processed transitions and the required actions as function detected external events current process state. The sequencer's micro-instructions present event data inputs to logic initiate operations. matrix, in turn, outputs defining initiating next state, be performed by microcode, status, response or output data. real-time, event-driven processor invention provides greater flexibility for reconfiguring patterns responses desired. It faster actions, it accomplishes this with larger repertoire stored smaller memory area, than has been prior art.

参考文章(16)
Wayne A. Moore, Emulator control sequencer ,(1981)
Stephen R. Colley, Doran K. Wilde, David G. Carson, David L. Budde, David B. Johnson, Robert P. Voll, Arbitration means for controlling access to a bus shared by a number of modules ,(1982)
Mark Poret, Jeanne McKinley, In-circuit emulator ,(1985)
Stephen R. Colley, William S. Richardson, Gurdev Singh, Dorn K. Wilde, John A. Bayliss, Roy H. Kravitz, Macroinstruction translator unit for use in a microprocessor ,(1980)
Anthony L. Cornish, David G. Carson, Craig B. Peterson, David L. Budde, David B. Johnson, Apparatus for redundant operation of modules in a multiprocessing system ,(1982)
Lyle O. Jevons, Richard A. Loskorn, Craig W. Harris, Data transfer network for variable protocol management ,(1982)
David I. Epstein, David L. Keating, James M. Guyer, Data processing system with unique microcode control ,(1982)
SurendarS Magar, Wanda Gass, Microcomputer device having test mode substituting external RAM for internal RAM Microelectronics Reliability. ,vol. 28, pp. 165- ,(1986) , 10.1016/0026-2714(88)90340-X